High Speed Inspecting and Taping Machine
- Control No
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- AKV620B
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- Patent No4876230
- Patent No4817337
Model No.
AFIT860CE (セラミックタイプ)
Descriptions
This machine performs electrical inspections and taping for tuning fork crystals via turret transfer, and performs high speed index inspection.
Features
- Realizes cycle time of 0. 3 sec. in combination with the turret transfer method and inspection index table.
- Equipped with inspecting substrate to measure frequency and impedance continuously during rotating transfer, on the inspection index table.
- Realizes space and energy savings even at the world's fastest level.
Specification
| Compatible Work | Tuning Fork Crystal |
|---|---|
| Inspection Content | Frequency, CI Measurement, and Drive Level |
| Cycle Time | 0. 3 sec/pc |
| Outer Dimension | W1400XD1300XH1700㎜ (excludes monitor and indicating light） |
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Compact sized crystal production machines
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Tuning fork crystal production machines
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Thermistor crystal production machines
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Transfer-related machines
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Lens assembly machines
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